Credit Risk Measurement: New Approaches to Value at Risk and Other Paradigms, 2nd Edition

  • Hardcover: 288 pages
  • Publisher: John Wiley & Sons; 2nd edition (February 1, 2001)
  • Language: English
  • ISBN-10: 047121910X

Ed Altman, Max L. Heine Professor of Finance, NYU Stern School of Business
“Credit risk management and portfolio decisions on credit assets have become far more complex and controversial in recent years. Tony Saunders has written an important cogent summary and analysis of the various new models that have emerged in recent years to tackle these complexities. Never has this type of analysis been more relevant-a must read for credit practitioners, banking regulators, and researchers of financial institutions and markets.”